test_iostream: refactor SDR input sample test so it can be reused #693
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This PR is a small piece extracted from #678 on the principle that smaller changesets are easier to review.
This change makes the SDR input sample test parametrizable. The previous test relied on i_en having to toggle every clock cycle, so to remove that requirement we are now toggling the clk_out output every time i_en is on, and as such the
save_expected_sample_values_tb
testbench must also look at both edges of clk_out in order to determine when we're supposed to sample the signal.Docstrings have also been improved.
This PR only slightly changes the behavior of the test (because clk_out waveform is now different), however the test coverage remains the same!